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Designing Reliable Thermal Measurements for Thin Films and Bonded Interfaces
As power densities rise and material stacks become more complex, thermal performance is increasingly governed by phenomena that conventional measurement tools struggle to resolve. Thin films, bonded interfaces, and high thermal conductivity materials introduce directional heat flow, dominant interfacial effects, and signal sensitivity challenges that leave many engineering questions unanswered.
This webinar explores what becomes measurable when advanced thermal metrology techniques are applied to real-world thin film and bonded systems. We will focus on extracting cross-plane and in-plane thermal conductivity, directly quantifying thermal boundary resistance in multilayer stacks, and measuring high thermal conductivity thin materials that cannot be reliably characterized with bulk steady-state or laser flash methods.
Using Aluminum Nitride (AlN) as a representative high-conductivity material, we will examine common measurement barriers. These include isolating film conductivity from substrates, separating intrinsic material properties from interfacial effects, handling sub-10 micron bondlines, and overcoming the small temperature gradients that limit signal quality in traditional tools. We will also discuss how anisotropy, multilayer architectures, and thin-films at the coupon and at the wafer introduce additional complexity that must be addressed through thoughtful measurement design.
Attendees will gain a clearer understanding of how to design reproducible workflows for directional thermal property extraction, reduce engineering risk associated with interface-dominated systems, and unlock measurements that were previously inaccessible. This session is designed for TIM developers, substrate engineers, advanced packaging teams, materials R&D groups, and reliability engineers seeking deeper visibility into heat transport across thin, high-performance material systems.
Speaker Spotlight
Hans Olson – Vice President of Product Development at Laser Thermal
Hans Olson has spent nearly a decade advancing thermal property characterization of bulk and thin film materials while building state-of-the-art optical systems for precision measurement. He earned his PhD in Mechanical and Aerospace Engineering from the University of Virginia and now leads FASTR development at Laser Thermal, commercializing thermo-reflectance metrology.
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