Access This Ion Beam Milling Infographic for SEM Sample Preparation
Materials scientists and SEM researchers can use this infographic to compare BIB milling techniques for producing artifact-free specimens across composite, multilayer, and heat-sensitive materials.
What you will learn about:
- Compare BIB flat milling and cross-section milling against conventional methods including mechanical polishing, microtome sectioning, and FIB
- Identify the advantages of BIB for composites, multilayered structures, and heat-sensitive specimens that challenge traditional sample preparation
- Evaluate Hitachi High-Tech IM4000 II and IM5000 system capabilities, including cryo holders, multi-sample holders, extra-wide area cross-sections,and inert gas specimen transfer
- Apply damage-prevention strategies such as lower accelerating voltage, pulsed interval milling, and active liquid nitrogen cooling for sensitive materials
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More Information
Broad argon ion beam (BIB) milling is a sample preparation technique that uses accelerated Ar ions to remove material from a specimen surface without mechanical contact, preserving the microstructure for high-resolution SEM and EBSD analysis.
Conventional methods such as cleaving, mechanical polishing, and microtome cutting introduce artifacts in composites and layered materials with mixed hardness. This infographic helps materials scientists and electron microscopists compare BIB to those techniques, evaluate the advantages of flat milling and direct cross-sectioning, and select the right Hitachi High-Tech system (IM4000 II or IM5000) for cryo, multi-sample, and atmosphere-free workflows.
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